Application Note

Measuring Challenges Of Wide Divergent Beams

By Yoni Groisman, Karol Sanilevitch, Roei Yiftah, Dr. Simon Rankel

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To guarantee the high quality of VCSELs, LEDs, edge emitting, and fiber laser devices, it is essential to analyze the beam profile. However, wide, divergent beams place specific requirements on the measurement system. The apertures of conventional beam profilers are too small to collect the entire spot of large or divergent light sources, while diverging beams cannot be accurately measured with regular detectors. These challenges have now been addressed with the Ophir Wide Beam Imager – WB-I, a calibrated optical accessory for beam profiling cameras. Download the full paper for more information.

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