Laser Beam Profiling

Near-Infrared (NIR) and Short Wave Infrared (SWIR) laser beam profiling is essential for accurately characterizing spatial attributes of laser beams such as beam width, divergence, and pointing direction. These characteristics are crucial for predicting how a laser beam will propagate and perform in various applications, from precision industrial tasks to medical treatments. Profiling helps ensure that laser-based systems operate efficiently, safely, and consistently, particularly in high-stakes environments like laser welding, cutting, fiber optics communication, and laser printing.

Laser beam profiling provides detailed insight into beam quality, spatial distribution, and uniformity—factors that directly impact the effectiveness and reliability of the final product or system. Without this analysis, laser tools may underperform or cause process variability, leading to product defects or operational failures.

Sensors Unlimited Inc. (SUI) offers InGaAs cameras that are ideally suited for NIR and SWIR laser beam profiling in the 0.9 to 1.7 µm wavelength range. These cameras feature square pixels for consistent, high-resolution imaging and a linear power response for accurate intensity measurement. Their programmable integration times and variable gain settings provide a broad dynamic range, making them capable of handling high-intensity laser outputs without saturation while still detecting weaker beam features.

Such performance makes SUI’s InGaAs detectors an indispensable tool for engineers and researchers who need to analyze and optimize laser systems with precision. Whether in development labs or production lines, accurate beam profiling ensures optimal laser performance, supporting innovation and quality control in laser-enabled technologies.