Laser Beam Measurement: Camera-Based Near Field Profilers

Near-field profiling is a common technique used to analyze small beams, and involves using a microscope objective lens to image the beam onto a camera detector array. This technique extends the measurement range of the profiler. Near-field profiling is performed in fiber and waveguide analysis, lens characterization, and other applications where beams 50 microns or smaller are analyzed. Photon offers near-field profilers using either camera-based beam profilers or scanning slit profilers.

Photon offers a line of camera based near-field profilers based on the 2/3-inch USBeamPro CMOS camera and the 1/2-inch and 2/3-inch FireWire CCD cameras. The systems include the camera, ATP-SM continuously variable attenuator, bracket and 60X magnification microscope objective lens, with broadband AR coating. While there are more accurate techniques to measure these beam sizes, the camera provides two-dimensional information that cannot always be obtained through knife-edge or scanning slit methods.

Photon offers a line of camera based near-field profilers based on the 2/3-inch USBeamPro CMOS camera and the 1/2-inch and 2/3-inch FireWire CCD cameras. The systems include the camera, ATP-SM continuously variable attenuator, bracket and 60X magnification microscope objective lens, with broadband AR coating.

Optional accessories include and optical rail and 3-axis manual stage. Other magnification lenses are also available.

The near field of the test beam or sample is imaged with the microscope objective lens and relayed to the camera. The bracket mounting fixture holds both the lens and camera, which itself can be mounting on a positioner or optical rail. This complete system provides everything necessary to perform near-field measurements right out of the box.