Datasheet: InGaAs SWIR Area Camera for Photovoltaic Inspection

Shortwave infrared area and linescan cameras are used for solar cell inspection

UTC Aerospace Systems (Sensors Unlimited Products) announces that high resolution, shortwave infrared (SWIR) area and linescan cameras are being used to improve the manufacturing yield of photovoltaic cells. SWIR technology is well suited to monitor the quality of solar thin films, concentrated PV, and crystalline cells, to maximize efficiency of the solar cell manufacturing process through final assembly of the completed modules.

The InGaAs-based SWIR cameras, which operate between 0.9 to 1.7 microns, are ideal for inspecting silicon boules and wafers due to the material’s transparency beyond 1.2 microns.