Guest Column | June 5, 2008

The Development of High Speed, Extended Wavelength Response InGaAs Detectors For NIR Spectroscopy And Machine Vision

The Development of High Speed, Extended Wavelength Response InGaAs Detectors For NIR Spectroscopy And Machine Vision

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Article: The Development of High Speed, Extended Wavelength Response InGaAs Detectors For NIR Spectroscopy And Machine Vision

By Marc P. Hansen, Sensors Unlimited Inc., An RTX Company

The spectroscopy and machine vision markets have been searching for a low-cost short-wave infrared (SWIR) detector that is capable of achieving high sensitivity with high speed in the most demanding applications. Before the recent release of Sensors Unlimited’s LC read out integrated circuit (ROIC), the only option that met this need was a high-cost detector requiring cryogenic cooling. These measurements can now be made with a cost-effective TE-cooled detector designed with performance-enhancing electronics that has one mode for longer integration times with lower noise and another mode for high-speed, high-gain measurements.

Click Here To Download:
Article: The Development of High Speed, Extended Wavelength Response InGaAs Detectors For NIR Spectroscopy And Machine Vision

Sensors Unlimited Inc., An RTX Company