Hologenix

Hologenix offers a wide range of advanced wafer characterization and measurement equipment. In 1988, the Hologenix Magic Mirror surface inspection method received the Semiconductor International Technology Achievement Award for QC/QA & Testing. Since then, Hologenix has successfully introduced several inspection and analysis systems providing innovative solutions for diverse applications.

Hologenix helps customers meet advanced process inspection needs requiring unsurpassed sensitivity. We offer high-throughput production inspection machines to in-depth materials analysis instruments including:

Wafer Geometry, Thickness and Resistivity Gauges
Surface Inspection Defect Detection Systems
Metallic Contamination Analysis Equipment
Automated Vapor Phase Decomposition (VPD) Systems
UV Surface Mapping and Inspection Systems
Visualization and Analysis Software
UV Curing Systems