Datasheet | July 30, 2019

High Resolution Beam Profiling Camera: Ophir® SP920 Datasheet

Source: Ophir Photonics

The SP920 USB 3.0 Silicon CCD High Resolution Beam Profiling Camera is designed to accurately capture and analyze wavelengths from 190 nm – 1100 nm, with enhanced sensitivity at 1070 nm. The camera features a wide dynamic range, excellent signal to noise ratio, USB 3.0 interface, and BeamGage® beam analysis software. It is ideal for measuring CW and pulsed laser profiles in such high-speed applications as medical imaging, microscopy, or micromachining. For additional specifications on the SP920 beam profiling camera, download the datasheet.