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The manufacture and calibration of UHV positioning systems is a complex task that sometimes pits design and maintenance considerations against the instrument’s technical performance. Any positioning system designed for use in UHV must be robust, with a very low failure rate. The cleaning process for UHV stages is also critical.
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Navigating nanopositioner specifications from various vendors poses challenges due to differing definitions and units. Understanding the story behind these metrics is crucial for real-world applications. Here, we explore the significance of specifications like closed-loop resolution and methods such as Atomic Force Microscopy for accurate verification.
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Moving from micron- to nanoscale-level research forces researchers to better understand their own actions’ impact on passive factors that undermine precision. Simple modifications to an experiment or instrumentation can help researchers achieve precision goals without additional processing.
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An atomic force microscope (AFM) can be built using Mad City Labs products along with other off-the-shelf components. This application note describes the construction of a fully automated AFM with the addition of a camera with a coaxial illuminator to view the tip approach .
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