Ellipsometer System: SpecEl-2000-VIS
Source: Ocean Optics, Inc.
This Ellipsometer is used to determine the thickness and refractive index of a substrate as a function of wavelength by measuring polarized light reflected from its surface. An integrated light source, two polarizers fixed to 70°, a spectrometer, and a PC with a 32-bit Windows operating system are all housed in the SpecEl Ellipsometer.
The SpecEl Ellipsometer System can detect a single layer as thin as 0.1 nm and up to 5 µm thick. In addition, it can provide refractive indices to 0.005°. The system can be controlled through a PC, allowing the user to measure absorbance and thickness with the touch of a button.
Additional information on the SpecEl-2000-VIS Ellipsometer System.