Economical Fast Focus Scanning Systems For Microscopy And Metrology Applications

PI, a global leader in nanopositioning instrumentation, has extended its PIFOC series of microscopy products by two new economical nano-focus scanner packages for applications including surface metrology, super-resolution microscopy, light sheet microscopy, digital slide scanning, etc.

Two scanning ranges are currently available, the P-725.1CDE1S offers 100µm and the P-725.4CDE1S offers 400µm. The fast scanners are based on a closed-loop piezo flexure design with capacitive position feedback for high linearity, stability, and repeatability. A compact digital controller with software is included.

Features

•     Travel range: 100 or 400μm
•     Settling time: ≤ 19 or ≤ 35ms
•     Point repeatability, 10% step, 1 sigma: ≤ 20nm
•     Large clear aperture with Ø 29mm
•     Outstanding lifetime thanks to PICMA® piezo actuators
•     Nanometer resolution due to capacitive sensors
•     High guide accuracy due to zero-play flexure guides
•     Controller included

Industries Served

Surface metrology, semiconductor inspection, genome sequencing, 3D imaging, digital slide scanning, super-resolution microscopy, light sheet microscopy, fluorescence microscopy, interferometry, autofocus systems

PI Americas
https://www.pi-usa.us | info@pi-usa.us | (508) 832-3456

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