Cryogenic Probe Station: Model CRX-6.5K Datasheet

This cryogenic probe station features high stability cryogen-free operation from <10 K to 350 K (or 20 K to 675 K with an optional interchangeable high temperature sample stage), control stability to 20 mK, measurements from DC to 67 GHz, and much more. This system measures electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties of materials and test devices through non-destructive testing on both full and partial wafers up to 51 mm in diameter. Additional information on features, specifications, and more can be found on the available datasheet.