Bruker AXS Introduces Numerous New X-Ray and Optical Emission Spectroscopy Products

Chicago — Bruker AXS recently announced several new X-ray and optical emission spectroscopy (OES) products and solutions for life-science and advanced materials research, as well as for industrial analysis:

• The new MICROSTAR ULTRA™, an ultra-bright laboratory X-ray source for structural biology, is comparable in brightness to many second-generation synchrotron beamlines. Utilizing novel electron optics and the revolutionary new Hypercool™ cooling design (patent applied for), the MICROSTAR ULTRA produces unrivalled X-ray intensities, which are beneficial for all aspects of in-house crystallographic research, from high-throughput crystal screening to structure determinations with SAD phasing.

• The new and unique IµS™ X-ray microfocus source for crystallography and X-ray diffraction (XRD) is the result of a joint effort between Bruker AXS and Incoatec GmbH. The IµS is the brightest sealed-tube X-ray generator ever, and incorporates high-performance Quazar™ multilayer X-ray optics. The IµS offers numerous customer benefits that include no moving parts, a long lifetime without maintenance, excellent stability, no water-cooling and low cost of ownership.

• The next-generation liquid nitrogen-free XFlash® 4030 Silicon Drift Detector (SDD) for EDS microanalysis has a larger area of 30 mm² and can achieve energy resolution of 133 eV at 100,000 counts per second. The XFlash 4030 detector can be positioned very close to the sample and can achieve up to a threefold increase in detected signal at the same beam current. This is ideal for low beam current applications and for sensitive samples in electron microscopes, or for higher throughput in EDS analysis.

• The significantly enhanced S2 RANGER™ EDXRF spectrometer now also incorporates an XFlash® SDD detector, and can analyze all elements from sodium to uranium in concentrations from 100% down to ppm levels. Due to the superior energy resolution at high count rates, the new S2 RANGER with XFlash SDD offers better analytical performance for many petrochemical, metals analysis and other industrial applications.

• The new RoHS-QUANT™ XRF solution now offers a more reliable, accurate and faster method for quantitatively screening RoHS-regulated elements in electronic components. The new RoHS-QUANT solution can be used with Bruker AXS' S2 RANGER, S4 EXPLORER and S4 PIONEER XRF systems.

• The new Q8 CORONADO™ automated solution for metal foundries combines the proven high-performance Q8 MAGELLAN™ spark OES system with fully automated sample preparation. The affordable, compact Q8 CORONADO ensures reliable, rapid analysis of ferrous and non-ferrous samples with automated sample preparation, OES elemental analysis and data archiving for consistently high analytical quality and shorter sample turn-around times at low operational cost.

• The TRACER III-V is the world's first handheld vacuum XRF instrument with excellent light-element analysis capabilities and flexible software for museum, art and conservation analysis.

  SOURCE: Bruker BioSciences Corporation