Automation And Microscopy: Faster Test And Measurement
Source: PI (Physik Instrumente) LP

The world of nano-technology now uses the concept that constant velocity will get you to the destination faster than constantly stopped traffic. One technique puts this concept into practice through the use of a fast nano-focus device based on a piezo-ceramic actuator embedded in a flexure guided lens positioning mechanism from PI. This technique allows a comprehensive examination of micro well plates within seconds. Download the full application note for an overview of this new approach and the equipment used for a very repeatable process.
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PI (Physik Instrumente) LP
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