Application Note

Automation And Microscopy: Faster Test And Measurement

Source: PI (Physik Instrumente) LP

The world of nano-technology now uses the concept that constant velocity will get you to the destination faster than constantly stopped traffic. One technique puts this concept into practice through the use of a fast nano-focus device based on a piezo-ceramic actuator embedded in a flexure guided lens positioning mechanism from PI. This technique allows a comprehensive examination of micro well plates within seconds. Download the full application note for an overview of this new approach and the equipment used for a very repeatable process.