Active Vibration Isolation Systems: TS-LT Series
OptoSigma’s TS-LT Series of active vibration isolation systems are designed to provide sub-hertz vibration isolation across the six degrees of freedom. These systems are ideal for applications requiring reliable vibration reduction including atomic force microscopy, scanning probe microscopy, metrology, tribology, interferometry, and profilometry.
The inherent stiffness of the TS-LT system conveys excellent directional and positional stability, ensuring a stable and controlled measuring environment. Additional features include active isolation from 0.7 Hz to 1,000 Hz, passive isolation beyond 1,000 Hz, an internal feedback loop, and plug-and-play installation.
For more performance characteristics, features, and technical specifications, download the datasheet.