Government involvement in metrology can boost innovation, collaboration, and public trust, as well as foster economic growth. However, it also poses challenges like compliance costs and trade barriers.
By James MacKay, Ph.D., and Shannon Ghorbani, Mad City Labs
Extreme metrology applications involve more than enough unknown variables. Instrumentation whose performance has been proven should not be one of them.
In this article Bill Hennessey, founder and president of ALIO Industries, gives his views on the ever-changing and evolving demand for more and more precise motion control solutions and the creation of technology that stimulates innovation across the industry.
Products and components made for the aerospace sector are often mission-critical; both precision and reliability are vital to success. This places an onus on metrology tools to work well, feeding back measurement results that are right first time and right every time.
Alluxa’s thin film optical filter technology has advanced to the point where the spectral slopes and blocking levels are challenging even the best metrology equipment and techniques. This paper discusses challenges and provides solutions for measuring the spectral response of this new class of high-performance filters.
Peak power, average power, power density, energy density… all of those terms can be quickly confused and mixed up even by experienced laser users. In this short article, we’ll focus our efforts on one of these parameters: power density.
Much of the historical motivation for developing pulsed laser diodes has military roots. However, today’s technology improvements and cost reductions are opening new applications in metrology and medicine.
Spectroscopy technology using diamond-turned mirrors, beamsplitters, and other optical components is especially helpful for the detection of harmful chemical compounds that may be found in counterfeit opioids and other pharmaceutical drugs.
Magnetic Levitation, or MagLev, technology allows frictionless motion with resolution down to the sub-nanometer range as well as the active control of all six degrees of freedom, without any mechanical restrictions or connections.
OSI Optoelectronics offers three types of dual sandwich detectors. The silicon-silicon sandwich has one silicon photodiode placed on top of the other, with the photons of shorter wavelengths absorbed in the top silicon and the photons of longer wavelengths penetrating deeper, absorbed by the bottom photodiode.
