TECHNOLOGIES TO SEE AT SPIE PHOTONICS WEST 2018

• Application Systems

  OptoSigma offers a wide range of application systems that includes microscope units, alignment systems, interferometers, bio-photonics, and laser processing systems. These application systems are designed for many specific applications including polarization measurements, vacuum and oven measurements, and glass and film inspections.

• MHK C-Shape Stainless Steel Mirror Holders

  OptoSigma provides MHK C-shaped stainless steel mirror holders designed for 12.7 mm dichroic mirrors and beamsplitters. The holders feature high-resolution adjustment, and a knob-less design that is suitable for system integration.

• Short-Exposure, High-Power Sensors With Industrial Communications Protocol: Helios Plus

  The Helios Plus measures high-power industrial lasers of up to 12 kW by measuring the energy of a short time exposure to this power. The laser is set to pulse from 0.3 to several seconds. It measures the energy and exposure time of this sample of the power, and from this calculates the power. By keeping the pulse energy under 5 kJ, there is no need for water cooling and the sensor can be kept to a compact size.

• Compact, All-In-One LED Luminaire Measurement System: FluxGage

  The FluxGage is Ophir’s new compact measuring system for LED Luminaires that measures their total flux, color (CCT, CRI, Duv, chromaticity), and flicker. The system measures the total flux using solar panels instead of an integrating sphere, delivering the same functionality in one-third the size. 

• Digital Encoder Galvano Scanner: GM-1000 Series

  The GM-1000 series of digital encoder galvano scanners is comprised of four different models with variations in beam diameter, scan angles, small step response, and resolution.

• Nexview™ 3D Optical Surface Profiler

  The Nexview™ 3D optical profiler microscope stands out amongst competitive products by its ability to measure the topography of virtually any surface, irrespective of roughness, large steps and segments, thin films, steep slopes, with feature heights ranging from < 1 nm up to 20000 µm. It does all this in 3D, without contact, and provides the best qualities of other profiling technologies (stylus, confocal, focus scanning) without their limitations.