TECHNOLOGIES TO SEE AT SPIE PHOTONICS WEST 2018

• Application Systems

  OptoSigma offers a wide range of application systems that includes microscope units, alignment systems, interferometers, bio-photonics, and laser processing systems. These application systems are designed for many specific applications including polarization measurements, vacuum and oven measurements, and glass and film inspections.

• Near-Eye Display Solutions

  Optics Blazers manufactures Near-Eye Display combiners and other components for optimized display performance and see-through properties. With an integrated manufacturing chain, this company can deliver single reflective surface, multiple reflective surface, free-form, or diffractive combiners. Optics Blazers’ solutions are developed with cost and scalability in mind to serve the competitive consumer electronics market.

• MHK C-Shape Stainless Steel Mirror Holders

  OptoSigma provides MHK C-shaped stainless steel mirror holders designed for 12.7 mm dichroic mirrors and beamsplitters. The holders feature high-resolution adjustment, and a knob-less design that is suitable for system integration.

• Space, Satellite, and Astronomy Filters and Coatings

  Iridian Spectral Technologies offers filters and coatings for satellites and LEO instrumentation, including large format filters for astronomical observations (single band and multi-band pass filters), light absorbers/black coatings, dichroic mirrors and beam-splitters, and multi-element arrays.

• Compact sCMOS Camera pco.panda 4.2

  PCO introduces its latest camera innovation: the pco.panda 4.2, a state-of-the-art sCMOS camera featuring the same compact 65 x 65 x 65 mm dimensions. This camera provides outstanding quantum efficiency, up to 80%, and excellent image quality provided by the 16-bit sCMOS sensor.

• Nexview™ 3D Optical Surface Profiler

  The Nexview™ 3D optical profiler microscope stands out amongst competitive products by its ability to measure the topography of virtually any surface, irrespective of roughness, large steps and segments, thin films, steep slopes, with feature heights ranging from < 1 nm up to 20000 µm. It does all this in 3D, without contact, and provides the best qualities of other profiling technologies (stylus, confocal, focus scanning) without their limitations.