1. DLP® NIRscan™ Evaluation Module User’s Guide

    This user’s guide provides an overview of the DLP NIRscan evaluation module, powering up and operating the module, safety guidelines, and power supply requirements.

  2. Evaluation Module for NIR Spectrometers: DLP® NIRscan™

    The DLP NIRscan evaluation module includes the DLP45000NIR DMD chipset, a single-element extended InGaAs detector, driver electronics, a transmittance sampling module with a halogen lamp, 3 disposable cuvettes, and an embedded Linux operating system and web server based on BeagleBone Black architecture.

  3. NIR Chipset for DLP Based Spectrometers: DLP4500NIR 0.45 WXGA DMD Datasheet

    This chipset covers the 1350-2450 nm wavelength range and features a more than 30,000: 1 signal to noise ratio for <1 second measurements. When combined with a single element detectors, it acts as a replacement for InGaAs array-based detector designs.

  4. NIR Chipset for DLP Based Spectrometers

    Texas Instruments’ DLP4500NIR 0.45 WXGA DMD is a near-infrared chipset ideal for integration into chemical analysis spectrometers. It’s particularly suited for compressive sensing, 3D biometrics, machine vision, infrared scene projection, laser marking, optical choppers, microscopes, and optical networking applications.

  5. Low Power and Compact MWIR Camera Datasheet

    DRS Technologies’ ZafiroTM640 Micro is an MWIR camera with a 3.4µm – 4.8µm spectral response. It’s ideal for space-restricted imaging applications. For information on its features and specifications, download the datasheet.

  6. Measuring Lens Assembly Thickness with the 157 Series Optical Thickness Gauge

    This technical note provides details on how the 157 Series Optical Thickness Gauge by Bristol Instruments can be used to determine the precise thickness of cemented or air-spaced achromatic doublets and triplets (as well as more complex lens stacks), and other lens assemblies.

  7. Contact Lens Metrology with the 157 Series Optical Thickness Gauge

    This technical note explains how Bristol Instruments’ 157 Series Optical Thickness Gauge is ideal for contact lens metrology.

  8. Color Shift Evaluation Of An Aluminum Alloy As A Function Of Deposition Time

    This application note explains how Ocean Optics evaluated a color shift that occurred with the deposition of a thin film of an aluminum chrome alloy to a cured and powder coated wheel. The purpose was the study the shift in color as a function of deposition time.

  9. Effect of Sandblasting on the Specular Reflection from Encoder Wheels

    This application note describes a feasibility study in which the reflectivity of metal and plastic encoder wheels was measured before and after sandblasting.

  10. Novel Time-Resolved FLIM Measurements Method

    Given the increasing reliance on time-resolved fluorescence lifetime imaging microscopy (TRFLIM) measurements for various biological and clinical investigations, including calcium concentration, protein-protein interaction, cell locomotion, cancer research, and Alzheimer’s disease research, the joint utilization of new picosecond gating technology and a TRFLIM-specific rapid lifetime determination (RLD) processing algorithm can be of great benefit to researchers.