Datasheet: High Energy Focused Beam Profiler

One of the most challenging applications for laser beam profiling is to measure a beam that is focused to a small spot. This principle problem is that the beam often has a severe convergent angle and the focused spot is usually quite small. If the beam is CW, a NanoScan slit profiler is the right choice, but sometimes the power density of a very small spot exceeds damage threshold of the slit material. If the beam is pulsed, a camera will be required and conventional attenuation is very difficult or even impossible.