PureFocus850 Reduces Electronic Component Inspection Time By 95%

By Simon Bush, Prior Scientific

How PureFocus850 Helped to Reduce Inspection Time
Top-Electech assesses its electronic components by mounting them in resin and filing them down to allow imaging of the internal structure. This creates a subtly uneven surface comprised of materials with variable reflectance and contrast. Traditional software or hardware autofocus systems may struggle to maintain focus on this variable surface, but the PureFocus850 averages the signal reflected by the sample across the microscope’s field of view. This allows a consistent, reliable signal to be obtained while scanning across each sample, even where parts of the field of view are non-reflective, ensuring the sample is constantly in focus independently from the microscope user.

The amount of light reflected by the sample changes depending on the magnification of the objective. Settings can be saved for each objective on the microscope, ensuring seamless switching between high and low magnification without the need to manually adjust parameters to ensure the sample is kept in focus.