MadAFM™ Sample Scanning AFM
Source: Mad City Labs, Inc.
Introducing Mad City Labs new sample scanning atomic force microscope. Powered by our industry leading closed loop nanopositioners to ensure high resolution performance, true decoupled motion and virtually undetectable out-of-plane motion.
The MadAFM™ supports multiple microscopy modes – imaging, electrical, mechanical, magnetic, and force modes – and is controlled by AFMView® control and acquisition software. Among the ease-of-use features arautomated calibration and initialization and simple probe exchange. MadAFM™ is a tabletop sized AFM and does not require on-site installation services.
Features
- Low noise atomic step performance
- Calibrated flexure guided closed loop nanopositioners
- Less than 1nm out of plane motion over scan range
- Proprietary PicoQ® low noise sensors
- Long travel, high stability micropositioning
- Automated calibration and initialization
- Automated software and hardware setup
- Adjustable parameters for experienced users
- User-friendly probe exchange
- Simple to install, table top design
- Includes AFMView® software - hardware control & data acquisition
- Image analysis software option
Applications
- Atomic Force Microscopy
- Phase Microscopy
- Magnetic Force Microscopy
- Electric Force Microscopy
- Lateral Force Microscopy
- Scanning Tunneling Microscopy
- Kelvin Probe Microscopy
- Conductive AFM
- Electric Force Microscopy
- Piezoelectric Force Microscopy
- Nanolithography
- Biological AFM
Mad City Labs, Inc.
This website uses cookies to ensure you get the best experience on our website. Learn more