1. Pulsed Laser Diodes At 905 nm

    LASER COMPONENTS designs and produces high power pulsed laser diodes (PLDs) at 905 nm with high reliability, and high temperature stability. Applications for these laser diodes include range finding, speed monitoring, laser radars, security scanners, and laser light curtains, as well as in test and measurement systems.

  2. Silicon Avalanche Photodiodes

    The Silicon Avalanche Photodiodes (Si APDs) from LASER COMPONENTS are designed for operation in the wavelength range between 250 nm and 1100 nm. These Si APDs are ideal for the detection of extremely weak light intensities due to the avalanche effect on them.

  3. Pyroelectric DLaTGS Detectors

    LASER COMPONENTS offers Deuterated Lanthanum α Alanine doped TriGlycine Sulphate (DLaTGS) detectors that are ideally suited for FTIR applications. Designed with the highest possible performance and the most effective pyroelectric effects, these detectors can be produced with any configuration, including VM configurations and CM configurations.

  4. Infrared (IR) Arrays For NIR Spectroscopy

    LASER COMPONENTS offers a series of powerful IR arrays designed specifically for IR spectroscopy applications such as biomedical analysis. The IG22 array series consists of 256 rectangular pixels made of extended InGaAs with a TE2 cooler, and is manufactured with an element size of 30 µm x 250 µm, and a pitch of 50 µm.

  5. PbS And PbSe IR Detectors

    LASER COMPONENTS offers PbS and PbSe infrared (IR) detectors for applications detecting infrared radiation. The Polycrystalline lead sulfide detectors (PbS) detect infrared radiation in the wavelength range between 1 µm and 3.3 µm, and exhibit a higher sensitivity then Polycrystalline lead selenide (PbSe). The PbSe standard semiconductor detectors are designed to detect IR radiation between the 1 µm and 5.2 µm wavelength ranges.

  6. Thermal Imaging Cameras For Demanding R&D Applications: FLIR X8000sc/X6000sc Series

    The FLIR X8000sc/X6000sc Series of thermal imaging cameras is designed to provide the highest levels of thermal measurement performance alongside the most advanced connectivity. The FLIR X8400sc features up to 1280 x 1024 pixels to show the smallest details while assuring excellent measurement accuracy. The FLIR X6580sc has the ability to record up to 255 Hz in full 640 x 512 resolution, and the FLIR X6570sc can record up to 355 Hz using a 160 x 1 subwindow.

  7. Compact sCMOS Camera

    The new pco.panda 4.2 is a sCMOS sensor camera system designed to provide high quantum efficiency with low dark noise for applications including localization microscopy (PALM, STORM, dSTORM, GSDIM), light sheet fluorescence microscopy (LSFM, SPIM), structured illumination microscopy (SIM), and more. It also is housed in a compact, 65 x 65 x 65 mm3 package.

  8. Phantom® Miro® Digital High-Speed Camera Series

    The Phantom® Miro® series cameras are small, light-weight, flexible digital high-speed cameras designed for the most extreme and demanding environments. These modular cameras can create multi-camera configurations when connected to a Miro Junction Box, and included Phantom Camera Control software easily captures an event and adjusts cine characteristics for the best picture possible. Ideal applications include industrial trouble-shooting, mechanical analysis, motion analysis, and any other application requiring high-quality, high-speed imaging analysis.

  9. Absolute Position Measurement System: ZPS System

    The new ZPS™ System from Zygo Corporation is designed to measure absolute position via ultra-compact optical sensors with a resolution of 0.01 nm and less than 1 nm of non-linearity. The system is typically used for closed-loop feedback systems that require continuous streams of high-precision position data from multiple sensors to maintain precise positioning and alignment.

  10. Low-Noise Extreme Ultraviolet (EUV) Photodetector

    The SXUV20C is a new low-noise extreme ultraviolet (EUV) photodetector that is specially designed for high stability over long periods of time when exposed to high intensity EUV energy. The photodetector features superior responsivity in the 1 nm to 200 nm wavelength region, a large 20 mm2 circular active area that provides a substantial surface for easy alignment to the EUV laser, and superior hardness in extreme UV environments.