TriWave® Technology White Paper

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•White Paper: TriWave® Technology

By NoblePeak Vision Corporation

Introduction

Imaging in the Short Wave Infrared (SWIR) band (1-2µm) enables a broad range of applications from microscopy, solar panel inspection, medical and dental imaging, industrial inspection and particularly for passive night vision. The night sky emits substantially more light in the SWIR band than in the visible. However the spectral response of CMOS or CCD silicon based image sensors is limited to a maximum wavelength of about 1µm. To enable detection of the SWIR, imagers have traditionally been built using arrays of compound semiconductor detectors such as InGaAs, hybridized to a silicon read-out circuit. The imagers are prohibitively expensive for many applications.

Device and Process Technology

Alternatively, Germanium another semiconductor element is chemically compatible with silicon, has widespread use in CMOS production and is optically responsive from the visible to the SWIR (with a cutoff wavelength ~ 1600 nm) but until now, there has been no viable technique for integrating single-crystal germanium detectors on silicon.

Click Here To Download:
•White Paper: TriWave® Technology