Shortwave infrared (SWIR) cameras are sensitive to shorter IR wavelengths between visible light and 3 µm. With the addition of temperature measurement capabilities, SWIR cameras offer a win-win for anyone concerned with thermal analysis of high-temperature materials or processes.
Finding and fixing hot spots within ever-shrinking electronic systems has become more and more difficult. This webinar examines close-up and microscopic lenses and how they allow infrared cameras to make accurate temperature measurements on components less than 25 µm in size and image targets as small as 3.5 µm.
Common tools for non-contact temperature measurements include thermal imaging cameras and spot pyrometers. Thermal cameras, however, have several advantages compared to spot pyrometers, including image generation, temperature readings of each pixel of the entire image, and temperature readings from a longer distance.
As electronic circuit boards and components get smaller and more powerful, inherent heating becomes a concern. Infrared camera technology is helping save electronic design companies money through improved test times and better product design.
Recent advances in IR camera technologies, such as fast camera detector readouts and high-performance electronics, allow high-speed imagery. This article is part five of a handbook that discusses the use of ultra-high-speed thermography with IR cameras.