|
|
|
By John Oncea, Editor
NASA’s EMIT mission is mapping the prevalence of key minerals in dust-producing deserts. But — surprise! — it’s also detecting the presence of methane around the world.
|
|
|
|
|
By James MacKay and Jenice Con Foo, Mad City Labs
Through a deep knowledge of sensing technologies, technically adept personnel, and experience across a bevy of applications, Mad City Labs helps our customers operate smaller and more cost-effectively than any competitor.
|
|
|
Article
|
By Michael Li and William Yang,
BaySpec Inc.
Spectral imaging benefits from a well-calibrated instrument, an intuitive user interface, and pinpoint accuracy. BaySpec has combined all these attributes in one package.
|
|
Application Note
|
Laser Components USA, Inc.
This application note aims to explain the techniques for using pyroelectric detectors to measure the power and energy in CW and pulsed lasers. Also explored are the applications and subtleties that make these devices ideal for numerous power and energy uses.
|
|
Article
|
By Kévin Foster,
Gentec Electro-Optics, Inc.
A recurring question that we hear at Gentec-EO is about the minimum repetition rate that a pulsed laser should have to be properly measured by one of our power detectors.
|
|
Article
|
Vision Research, Inc.
While performance breakthroughs associated with our new image sensor design mainly rest on its BSI architecture, other design features boost performance beyond what BSI could accomplish alone.
|
|
|
White Paper
|
Alluxa, Inc.
Alluxa’s thin film optical filter technology has advanced to the point where the spectral slopes and blocking levels are challenging even the best metrology equipment and techniques. This paper discusses challenges and provides solutions for measuring the spectral response of this new class of high-performance filters.
|
|
Article
|
Iridian Spectral Technologies
In designing a filter solution, the filter manufacturer takes the values requested by the user and adds additional design margin to account for both functional effects and filter manufacturing effects such as edge steepness, nonuniformity, and wavelength targeting.
|
|
Article
|
By Tony Kitazawa,
Canon USA, Inc. Optoelectronic Components
Non-contact sensing is invaluable in applications where measurements may be rendered unacceptably imprecise by slippage and poor speed management, or equipment or products may be damaged by contact.
|
|
Article
|
Teledyne FLIR
Thermographic imaging is accomplished with a camera that converts IR into a visual image that depicts temperature variations across an object or scene. This article is part two of a handbook by FLIR that discusses the use of IR detectors in thermographic imaging.
|
|
|
|
|
Sensors Unlimited, a world leader in the research and development of InGaAs technology, explains the electromagnetic spectrum with a deep dive into the infrared waveband.
|
|
|
|
|
In this short video, G&H presents the polarization diverse receiver (PDR) for optical coherence tomography (OCT), with an overview of its features and benefits and how it integrates into an OCT system.
|
|
|
|
The AXUV300C photodiode offers a large, 331 mm2 rectangular active area with no window to allow for detection of energy shorter than 200 nm. Other features include a response time of 15 microseconds and electron detection as low as 200 eV.
|
|
Download Datasheet
|
• Request Information
|
Opto Diode, An ITW Company |
|
|
Abrisa Technologies offers high throughput efficiency wide angle, broad spectrum sensor and laser scanning window solutions for visible 425-675 nm (VIS), visible to near infrared 425-1,050 nm (VIS-NIR), short wave infrared 700-1,800 nm (SWIR), and popular laser and LED wavelengths from 405 to 1,550 nm.
|
|
Download Datasheet
|
• Request Information
|
Abrisa Technologies |
|
|
The Hawk Indigo camera uses a next-generation 2/3” CMOS sensor, enabling ultimate UV sensitivity and high QE of 36% at 250 nm.
|
|
Download Datasheet
|
• Request Information
|
Raptor Photonics Limited |
|
|
The APX-PSD-XVInG-3.1 is a high sensitivity, low noise, 2 mm diameter active area EXTENDED VISIBLE (ExV) InGaAs position sensitive detector for applications at visible, NIR, and SWIR wavelengths range.
|
|
Download Datasheet
|
• Request Information
|
Advanced Photonix, Inc. |
|
|
Connect With Photonics Online:
|
|
|
|
|
|
|
|