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| | | SPIE Optics + Photonics Preview |
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Laser Beam Profiling And Infrared Cameras
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By Raf Vandersmissen, Xenics
One of the key parameters for understanding how a laser will perform in an application is the spatial intensity distribution. In many industrial laser cutting or welding applications, monitoring the beam quality is critical for successful operation. This white paper addresses the general need for laser beam profile analysis, describes laser beam analysis instruments, and provides an overview of laser applications, in particular for infrared wavelengths.
Xenics | SPIE Optics + Photonics Booth 443
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Spotlight On SPIE Optics + Photonics |
SPIE Optics + Photonics 2017
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August 6 to 10, 2017 | San Diego, CA
SPIE Optics + Photonics 2017, the meeting where the latest research in optical engineering and applications, nanotechnology, sustainable energy, organic photonics, and astronomical instrumentation is presented. Four conferences and multiple application areas in one event.
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Glass Polarizer For The Near Infrared
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Hoya offers CUPO, a thin glass polarizer for the near-infrared wavelength region that is designed to use light absorption of copper particles by an electron plasma resonance. With special features such as high isolation, low loss, and high reliability, the CUPO is ideal for compact-size optical isolators.
HOYA Corporation USA Optics Division | SPIE Optics + Photonics Booth 633
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OEM Partnerships
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Mad City Labs has proven expertise in designing and producing custom nanopositioning systems for integration into a wide variety of technical products. More than 50 percent of production is dedicated to OEM designs.
Mad City Labs, Inc. | SPIE Optics + Photonics Booth 359
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RA-532H Surface Reflectance Analyzer Video Introduction
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The new RA-532H surface reflectance analyzer from Canon USA, Inc. Optoelectronic Components is capable of surface measurements at three different angles (20°, 60°, and 85°). Utilized measurement methods include standard compliant gloss, haze, image clarity (IC), and 1-D and 2-D BRDF (Bidirectional Reflectance Distribution Function) measurements. The analyzer can be used for a variety of evaluation and inspection applications with many types of surfaces such as film, paper, and automotive, printed, or painted surfaces.
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