From The Editor
Seeing Is Believing: VR/AR Headset Demos At SPIE Photonics West 2018
 
By Ed Biller, Editor, Photonics Online

It’s safe to say that, whatever the expectations happened to be for last Monday’s altered reality/virtual reality headset demos at SPIE Photonics West, the event's reality surpassed them.

Featured Article
Developing Silicon Photonics Technologies With A Wafer-Level Test Station
 
By Jeroen De Coster, Erik Jan Marinissen, and Joris Van Campenhout, imec; and Bryan C. Bolt, FormFactor, Inc.

Demand for I/O bandwidth has increased as logic chip compute power and memory chip storage capacity has grown. Silicon (SI) photonics is a promising technology for delivering a massive terabyte-per-second I/O aggregate bandwidth at the chip level, especially for applications requiring long interconnect distances. 

Spotlight On Test & Measurement
Interference Microscopy For Surface Structure Analysis
By Peter J. de Groot, Zygo

Utilizing interference microscopy techniques to measure the many aspects of surface structures takes advantage of rapid, non-contact operation and rapid data acquisition, often at data acquisition rates in the millions of 3D image points per second. 

Infrared Transmission System

Image Science has developed a system for measuring the transmission of small IR lenses in the LWIR and MWIR wavebands. The infrared transmission system measures absolute transmission and minimizes the problems posed by testing short focal length lenses.

Optical Thickness Gauge: 157 Series

The Model 157 optical thickness gauge uses proven optical interferometer technology to measure the absolute thickness of specialty plastic films, medical membranes, and ophthalmic products.

Helios Laser Power Meter For Industrial Automation

The Helios is a laser power meter designed for the measurement of high-power lasers in industrial processing applications. It measures an array of high-power solid state lasers such as diode, fiber, and YAG lasers with powers ranging from 100 W to 12 kW and energies ranging from 10 J to 10 kJ. 

Resources
Saving The Lens For Last?
By Stuart W. Singer and Jim Sullivan, Schneider Optics

Designers have been known to “save the lens for last” when creating vision systems with very specific black box dimensions and lighting, resolution, and pixel specifications. One solution to this dilemma is a new and improved design approach called concurrent engineering. 

Technical Note: Guide To Glass
By Abrisa Technologies

Guide to Glass provides information about the types of glass and their associated thermal, optical, chemical, mechanical, and electrical properties; Understand light and color, glare reduction, and glass strengthening methods using heat and chemicals.

Nondestructive Testing Of Mid-IR Optical Fiber Using Infrared Imaging
By TELOPS

Some materials used in the manufacture of optical fiber lasers cannot have any defects if the laser system is to be efficient. This app note shows how infrared imaging can be used to carry out NDT of optical fiber integrity. The methodology allows the screening of tens of meters in just a few seconds.

The Third Infrared Window
By Sensors Unlimited - UTC Aerospace Systems

Long-wave infrared (LWIR) and mid-wave infrared (MWIR) sensors and cameras have been used in military settings for detecting human activity through thermal emissions. Using the short-wave infrared (SWIR) portion of the spectrum extends unique capabilities that often compliment LWIR and MWIR imaging.

Bulletin Board
HermeS Hermetic Through Glass Via (TGV) Wafer For MEMS Devices
 

SCHOTT Electronic Packaging offers the HermeS glass substrate wafer with hermetically sealed solid “Through Glass Vias” (TGV) designed to enable fully gastight and long-term robust enclosures for MEMS devices such as industrial hermetic MEMS sensors, medical MEMS, and RF MEMS. It features vine-pitched vias that allow for reliable conduction of electrical signals and power into and out of MEMS devices.

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