Imaging Contributors

  1. Guest Column: Using A High-Line-Rate SWIR Line Scan Camera To Capture Fast-Changing Optical Light Variation
    11/12/2010
    This article describes observations about office lighting that were discovered while investigating ways to illustrate the speed of a new high-speed, indium gallium arsenide (InGaAs) line scan camera (SU1024LDH2). By Douglas Malchow, Sensors Unlimited – Goodrich ISR Systems
  2. Photonics West 2009: Companies On The Move
    2/26/2009
    As I reflect on Photonics West 2009, I can't help but think that the event was… well, lacking in space. Not that I, or anyone else who gathered at the San Jose Convention Center for North America's largest photonics exhibition last month, was necessarily complaining about it. Even though overall attendance seemed to be down a bit from last year, the exhibit hall was still overcrowded with booths, a clear indication that the industry is fairing pretty well — in spite of a struggling economy. Regardless, I think SPIE's decision to move the show to San Francisco's larger Moscone Center in 2010 was a good one.
  3. Article: NIR Trends: Machine Vision In The Short Wave Infrared
    2/19/2009
    Manufacturers have used cameras to monitor their processes since the first industrial cameras were made available. What do you do when there are no visible differences to distinguish good product from bad?
  4. Article: The Development of High Speed, Extended Wavelength Response InGaAs Detectors For NIR Spectroscopy And Machine Vision
    6/5/2008
    The spectroscopy and machine vision markets have been searching for a low-cost short-wave infrared (SWIR) detector that is capable of achieving high sensitivity with high speed in the most demanding applications. Before the recent release of Sensors Unlimited's LC read out integrated circuit (ROIC), the only option that met this need was a high-cost detector requiring cryogenic cooling. These measurements can now be made with a cost-effective TE-cooled detector designed with performance-enhancing electronics that has one mode for longer integration times with lower noise and another mode for high-speed, high-gain measurements.

First 1 1 (Last)