Are you looking to take the guesswork out of determining your laser's performance and quality?

• Do you need quick, easy results for even complex optical measurements?
• Do you worry about getting consistent results?
• Are you tired of arguments with your vendors or customers about laser performance?

Customers around the world, including major laser manufacturers, optical component suppliers, OEM laser system builders, and companies working on laser, electro-optic, and photovoltaic research and development, have come to Photon for their laser measurement solutions.

Find out why you should, too.

Laser Beam Profilers for Virtually Every Application

Scanning Slit Profilers NanoScan and High Power NanoScan provide nanometer accuracy and precision for beam pointing and width measurements, allowing rapid, precise optical alignment and component assembly with orders of magnitude greater precision than the legacy BeamScan. Using two slits to obtain orthogonal beam widths with one mechanical motion, it provides real-time measurements up to every 50ms (20Hz update rate).
Camera-Based Profilers Camera-based profiler solutions, using either the FireWire BeamPro or USBeamPro, provide highly accurate measurements on both pulsed and CW lasers with wavelength from 190nm to 1100nm over a wide range of beam widths and power/energy levels.
M2 Measurements The NanoModeScan makes M2 measurements of almost any laser within as little as 20 seconds. The ModeScan Model 1780 makes real-time instantaneous M2 measurements for lasers with wavelengths from 190nm to 1100nm.
Near-Field Profilers Near-field profiling is a common technique used to analyze small laser beams and other sources such as laser diodes, VCSELs, optical fiber, and/or waveguides. The technique involves a microscope objective lens to image the beam onto a detector. Photon has several near-field profiling instruments, based on both the NanoScan and BeamPro profilers to fit a variety of applications.
Far-Field Profilers Far-Field Profilers use goniometric radiometer technology to provide real-time measurements of divergent light sources. Based on a patented scanning method in which neither the source nor the detector moves, user obtains full 3D hemispheric irradiance measurements with high spatial resolution. The Goniometer makes XY measurements in a few seconds; full 3D measurements from 20 seconds to 2 minutes depending on the phi angle resolution required. The LED Profiler is a far-field profiler that generates high dynamic range light intensity profiles of LEDs. The system characterizes the LED profile over a 260 degree wide range-of-view, and generates a complete, 3D profile of the test source. A thermo-electric cooled vacuum chuck option is also available to test bare-chip LEDs over a range of temperatures.