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High Speed NIR Line-Scan Detector: Xlin Detector Series Datasheet
The Xlin High Speed NIR Line-Scan Detector series features a line rate of 40 kHz and a resolution of 512 or 1024 pixels in combination with 12.5 µm pitch. This unique set of features enables more accurate inspection and smaller particle detection at short wavelengths making the Xlin detector ideal for high-speed imaging applications in machine vision and spectroscopy. There are three resolution offerings of 512, 1024 and 2048 pixels at different pixel formats ranging from the smallest in the world of 12.5 x 12.5µm2 to 25 x 250 µm2 rectangular pixels. Due to their high sensitivity and quantum efficiency these high speed line-scan detectors operate at very low illumination levels. The high line rate of 40 kHz (1024 pixels version) and 10 kHz (2048 pixel version) enables a high resolution in the time domain.
High speed NIR line-scan detectors - Xlin detectors Key Benefits:
- InGaAs detector
- 0.9 to 1.7 µm sensitivity
- High-speed Frame rate 40 kHz or 10 kHz (2048 version)
- Best signal-to-noise performance
- Optional TE3 cooling for low-light-level spectroscopy
- High sensitivity
- Unique combination of high resolution with smallest pixel pitch of 12.5 µm
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