With the widespread use of anti-reflective optical coatings, multilayer dielectric coatings, solar controlling thin films, and laser mirrors, specular reflectance measurements have become even more important for research and QC applications.
Specular reflectance measurements are used to characterize the film thickness, refractive index, and other optical properties of these materials. Labsphere has designed a series of specular reflectance accessories that allows specular reflectance measurements to be performed at five key beam incidence angles: 8°, 15°, 30°, 45°, and 60°. Called the PELA-6000 "VN" Series Accessories, this series of reflectance accessories is designed exclusively for the Perkin Elmer Lambda 900 Spectrophotometer. Submitted By Labsphere,Inc.
Labsphere, Inc.
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