Application Note: SWIR Imaging In Solar Cell Inspection
Source: Xenics
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Application Note: SWIR Imaging In Solar Cell Inspection
Application Note: SWIR Imaging In Solar Cell Inspection
Application Note: SWIR Imaging In Solar Cell Inspection
Solar cells are large-area semiconductor devices with typical dimensions of 15 cm. Loss mechanisms such as locally reduced diffusion lenghts or parallel resistances often reduce the energy conversion efficiency of solar cells. Characterization techniques that can provide spatially resolved information about the performance of a solar cell therefore are important to manufacturers not only in research and development but also in solar cell production.
Click Here To Download:Application Note: SWIR Imaging In Solar Cell Inspection
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