Reflex Photonics Launches A Line Of Optical Testers To Simplify Testing Of Its LightABLE Rugged Transceivers And Of Optical Interconnects

(PRWEB) - Recognizing the need for a ready-made test bench for its line of transceiver modules, Reflex Photonics introduces a complete line of Optical Tester for BER measurements on the LightABLE™ SR4 and SR12 rugged embedded transceivers and optical interconnects.

Currently, Reflex Photonics offers these different optical test instruments: 

• Optical Tester SR4 40G (Enables BER measurement)
• Optical Tester SR12 120G (Enables BER measurement)
• Optical Generator/Tester SR12 120G (Generates PRBS and includes BERT capability)

The Reflex Photonics Optical Testers will speed up the LightABLE performance validation and confirm successful integration into your system as it enables BER and eye diagram tests over the SR4 and SR12 transceivers. In addition, those products will enable your communication system BER assessment.

The Optical Generator/Tester integrates a PRBS (pseudo random bit signal) generator and an embedded BER measurement capability. This instrument acts like a BERT as it will directly perform optical communication system BER assessment. It will also act as an optical cross-connect OXC.

The LightABLE products are parallel optic interconnects operating at 10 Gbps per lane and offering the following features: small SWaP, operation over a large temperature range (-40 °C to 85 °C), storage temperature from -57 °C to 125 °C. The LightABLE can be surface mounted or plugged on a board, and will support high temperature reflow process and operation with a link budget better than 13 dB.

Dr. Jocelyn Lauzon, V.P. Engineering at Reflex Photonics adds: "Obviously, you can do the characterization of our transceiver, but if you replace the loopback cable by a bi-directional parallel optic communication system, the Optical Tester can be used to characterize the performance of a whole communication system. The communication bit rate and protocol can be changed, so the Optical Tester can be used to test different system architectures."