Photoluminescence Testing Makes Better Solar Cells At Lower Costs

Photoluminescence detectors can be used to determine a silicon solar cell’s efficiency early in the manufacturing process. Conventional CCD image sensors cannot overcome the weak effect that occurs in the NIR and SWIR regions during luminescence though. This white paper explains how NIR and SWIR cameras based off of InGaAs technology can be used for defect detection in in-line inspection of high-volume solar cell manufacturing lines.