LASER COMPONENTS offers PbS and PbSe infrared (IR) detectors for applications detecting infrared radiation. The Polycrystalline lead sulfide detectors (PbS) detect infrared radiation in the wavelength range between 1 µm and 3.3 µm, and exhibit a higher sensitivity then Polycrystalline lead selenide (PbSe). The PbSe standard semiconductor detectors are designed to detect IR radiation between the 1 µm and 5.2 µm wavelength ranges.
The PbS detectors are ideally used in applications that require large-area detectors because they are significantly less expensive than comparable InGaAs detectors. Typical chip sizes for LASER COMPONENTS detectors are 2 mm x 2 mm, but other configurations are available upon request.
PbSe detectors have a particularly strong inner photoelectric effect, in that the resistance is reduced when infrared light reaches the detector. They can be used when uncooled at wavelengths up to 4.7 µm, and at room temperature, they demonstrate a detectivity D* of greater than 1010. PbSe detectors are able to achieve an even high performance levels and a wavelength shift to 5.2 µm at lower temperatures.
For more information on the different PbS and PbSe IR Detector series offered by LASER COMPONENTS, download the available datasheets.