Application Note

Measuring Pulsed Lasers With NanoScan 2s

Source: MKS Ophir

The NanoScan 2s is a scanning slit, sensor-based, beam profiling system designed to profile pulsed laser beams with repetition rates in the 10 kHz range and above, and incorporate a “peak connect” algorithm to enable pulsed laser measurements. This application note discusses how the NanoScan 2s uses two modes of pulse operation for accurate beam profiling. Download the full paper for more about the short pulse and long pulse modes, and when use for each mode is recommended.

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MKS Ophir