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SUI (Sensors Unlimited, Inc.), part of Goodrich Corporation manufacturers of shortwave infrared (SWIR) sensors and imaging systems made with indium gallium arsenide (InGaAs) technology, announces their breakthrough 640 x 512 pixel resolution, dual-wavelength SU640SDVVis-1.7RT Visible-InGaAs Area Camera. The new dual-wavelength, large format sensor features an unprecedented high sensitivity that captures images from both the visible and the SWIR wavelengths, from 400 nm to 1700 nm. The focal plane array (FPA) simultaneously images in both wavelengths, providing a readily recognizable, combined image with unparalleled high resolution.

Compact and versatile, the new Visible-InGaAs FPA dramatically increases responsivity with quantum efficiency of 45 percent at 800 nm, an unprecedented 80 percent at 1310 nm and 75 percent at 1550 nm on a small 25 micron pitch. SUI's new Visible-InGaAs Area Camera operates with increased sensitivity across the visible and SWIR spectral range with a 100 percent pixel fill factor.

The SWIR video camera has both EIA-170 analog and simultaneous 14-bit digital video CameraLink® compatible outputs. Operating at room temperature, the solid-state, compact camera features factory set non-uniformity corrections at 8 operational settings. Other features include individual pixel correction, external triggering and windowing.

Applications for the high resolution, visible-SWIR detector include hyperspectral imaging and imaging both eye-safe and visible lasers simultaneously, which is particularly useful for seeing laser designators. Industrial uses span commercial markets such as astronomy, wafer inspection, wavefront sensing, thermography and spectroscopy.

The Visible-InGaAs dual-wavelength focal plane array from SUI is available in several popular geometries, including the 320 x 240 pixel resolution on a 40 micron pitch. The 320 x 256 and 640 x 512 pixel element arrays are both available on a 25 micron pixel pitch.

SOURCE: Sensors Unlimited - Goodrich ISR Systems